-
3
-
-
0343435902
-
-
[3] D. Marquarding, H. Klusacek, G. Gokel, P. Hoffmann and I. Ugi, J. Am. Chem. Soc., 92 (1970) 5389.
-
(1970)
J. Am. Chem. Soc.
, vol.92
, pp. 5389
-
-
Marquarding, D.1
Klusacek, H.2
Gokel, G.3
Hoffmann, P.4
Ugi, I.5
-
4
-
-
0001518473
-
-
[4] T. Hayashi, T. Mise, M. Fukushima, M. Kagotani, N. Nagashima, Y. Hamada, A. Matsumoto, S. Kawakami, M. Konishi, K. Yamamoto and M. Kumada, Bull. Chem. Soc. Jpn., 53 (1980) 1138.
-
(1980)
Bull. Chem. Soc. Jpn.
, vol.53
, pp. 1138
-
-
Hayashi, T.1
Mise, T.2
Fukushima, M.3
Kagotani, M.4
Nagashima, N.5
Hamada, Y.6
Matsumoto, A.7
Kawakami, S.8
Konishi, M.9
Yamamoto, K.10
Kumada, M.11
-
6
-
-
37049073966
-
-
[6] B. Jedlicka, Ch. Kratky, W. Weissensteiner and M. Widhalm, J. Chem. Soc., Chem. Commun., (1993) 1329.
-
(1993)
J. Chem. Soc., Chem. Commun.
, pp. 1329
-
-
Jedlicka, B.1
Kratky, Ch.2
Weissensteiner, W.3
Widhalm, M.4
-
7
-
-
0000182010
-
-
[7] H. Wally, Ch. Kratky, W. Weissensteiner, M. Widhalm and K. Schlögl, J. Organomet. Chem., 450 (1993) 185.
-
(1993)
J. Organomet. Chem.
, vol.450
, pp. 185
-
-
Wally, H.1
Kratky, Ch.2
Weissensteiner, W.3
Widhalm, M.4
Schlögl, K.5
-
8
-
-
0027466816
-
-
[8] H. Wally, K. Schlögl, W. Weissensteiner and M. Widhalm, Tetrahedron Asymm., 4 (1993) 285.
-
(1993)
Tetrahedron Asymm.
, vol.4
, pp. 285
-
-
Wally, H.1
Schlögl, K.2
Weissensteiner, W.3
Widhalm, M.4
-
9
-
-
33947487479
-
-
[9] M. Rosenblum, A.K. Banerjee, N. Danieli, R.W. Fish and V. Schlatter, J. Am. Chem. Soc., 85 (1963) 316.
-
(1963)
J. Am. Chem. Soc.
, vol.85
, pp. 316
-
-
Rosenblum, M.1
Banerjee, A.K.2
Danieli, N.3
Fish, R.W.4
Schlatter, V.5
-
17
-
-
0000488020
-
-
[17] T. Hayashi, M. Konishi, Y. Kobori, M. Kumada, T. Higuchi and K. Hirotsu J. Am. Chem. Soc., 106 (1984) 158.
-
(1984)
J. Am. Chem. Soc.
, vol.106
, pp. 158
-
-
Hayashi, T.1
Konishi, M.2
Kobori, Y.3
Kumada, M.4
Higuchi, T.5
Hirotsu, K.6
-
19
-
-
0000778608
-
-
Siemens Analytical Instruments, Inc., Madizon, WI
-
[19] The following computer programs were used for the crystallographic work: SHELXTL PC, Version 4.1, Siemens Analytical Instruments, Inc., Madizon, WI, 1990; G.M. Sheldrick, SHELXL-93, a Program for Refinement of Crystal Structures from Diffraction Data, University of Göttingen, 1993; DIFABS, N. Walker and D. Stuart, Acta Crystallogr., Sect. A, 39 (1983) 158.
-
(1990)
SHELXTL PC, Version 4.1
-
-
-
20
-
-
0000778608
-
-
University of Göttingen
-
[19] The following computer programs were used for the crystallographic work: SHELXTL PC, Version 4.1, Siemens Analytical Instruments, Inc., Madizon, WI, 1990; G.M. Sheldrick, SHELXL-93, a Program for Refinement of Crystal Structures from Diffraction Data, University of Göttingen, 1993; DIFABS, N. Walker and D. Stuart, Acta Crystallogr., Sect. A, 39 (1983) 158.
-
(1993)
SHELXL-93, A Program for Refinement of Crystal Structures from Diffraction Data
-
-
Sheldrick, G.M.1
-
21
-
-
0000778608
-
-
[19] The following computer programs were used for the crystallographic work: SHELXTL PC, Version 4.1, Siemens Analytical Instruments, Inc., Madizon, WI, 1990; G.M. Sheldrick, SHELXL-93, a Program for Refinement of Crystal Structures from Diffraction Data, University of Göttingen, 1993; DIFABS, N. Walker and D. Stuart, Acta Crystallogr., Sect. A, 39 (1983) 158.
-
(1983)
Acta Crystallogr., Sect. A
, vol.39
, pp. 158
-
-
Walker, N.1
Stuart, D.2
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