High-resolution profiling of the polyimide-polyimide interface

Macromolecules

Volumn 29, Issue 21, 1996, Pages 6880-6891

  Stoffel, N C ^a   Dai, Ch A ^a   Kramer, E J ^a   Russell, Th P ^a   Deline, V ^a   Volksen, W ^a   Wu, W ^a   Satija, S ^a  

^a Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CASTING; INTERFACIAL ENERGY; NEUTRON REFLECTION; POLYIMIDES; SECONDARY ION MASS SPECTROMETRY;

BASE LAYER; HIGH-RESOLUTION PROFILING; INTERFACIAL FRACTURE ENERGY; INTERFACIAL WIDTH; NEUTRON REFLECTOMETRY; NUCLEAR REACTION ANALYSIS; POLYIMIDE-POLYIMIDE INTERFACE;

INTERFACES (MATERIALS);

EID: 0030573898     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma9601880     Document Type: Article

References (29)