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Volumn 32, Issue 12, 1996, Pages 1143-1144

Kink modification using body contact bias in InP based InAIAs/InGaAs HEMTs

Author keywords

Gallium indium arsenide; High electron mobility transistors

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRODES; MOLECULAR BEAM EPITAXY; REACTIVE ION ETCHING; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

EID: 0030572227     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960726     Document Type: Article
Times cited : (6)

References (8)
  • 1
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  • 2
    • 0028274460 scopus 로고
    • 0.05-μm-gate InAlAs/InGaAs high electron mobility transistor and reduction of its short-channel effects
    • ENOKI, T., TOMIZAWA, M., UMEDA, Y., and ISHII, Y.: '0.05-μm-gate InAlAs/InGaAs high electron mobility transistor and reduction of its short-channel effects', Jpn. J. Appl. Phys., 1994, 33, pp. 798-803
    • (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 798-803
    • Enoki, T.1    Tomizawa, M.2    Umeda, Y.3    Ishii, Y.4
  • 3
    • 0029225967 scopus 로고
    • 40-Gb/s-class InP HEMT ICs for very-high-speed optical communications
    • IMAI, Y., NAKAMURAm M., KIMURA, S., UMEDA, Y., and ENOKI, T.: '40-Gb/s-class InP HEMT ICs for very-high-speed optical communications'. Proc. IPRM, 1995, pp. 89-92
    • (1995) Proc. IPRM , pp. 89-92
    • Imai, Y.1    Nakamura, M.2    Kimura, S.3    Umeda, Y.4    Enoki, T.5
  • 4
    • 0016574231 scopus 로고
    • Properties of ESFI MOS transistors due to the floating substrate and the finite volume
    • TIHANYI, J., and SCHLÖTTERER, H.: 'Properties of ESFI MOS transistors due to the floating substrate and the finite volume', IEEE Trans. Electron Devices, 1975, ED-22, pp. 1017-1023
    • (1975) IEEE Trans. Electron Devices , vol.ED-22 , pp. 1017-1023
    • Tihanyi, J.1    Schlötterer, H.2
  • 5
    • 0028697187 scopus 로고
    • Device technologies for InP-based HEMTs and their application to ICs
    • ENOKI, T., KOBAYASHI, T., and ISHII, Y.: 'Device technologies for InP-based HEMTs and their application to ICs'. IEEE GaAs IC Symp., 1994, pp. 337-340
    • (1994) IEEE GaAs IC Symp. , pp. 337-340
    • Enoki, T.1    Kobayashi, T.2    Ishii, Y.3
  • 6
    • 0029490914 scopus 로고
    • A new physical model for the kink effect on InAlAs/InGaAs HEMTs
    • SOMERVILLE, M.H., DEL ALAMOm J.A., and MOKE, w.: A new physical model for the kink effect on InAlAs/InGaAs HEMTs'. IEDM Tech. Dig., 1995, pp. 201-204
    • (1995) IEDM Tech. Dig. , pp. 201-204
    • Somerville, M.H.1    Del Alamo, J.A.2    Moke, W.3
  • 7
    • 84866956453 scopus 로고
    • Body contacts in InP-based InAlAs/InGaAs HEMTs and their effects on breakdown voltage and kink suppression
    • SUEMITSU, T., ENOKI, T., and ISHII, Y.: 'Body contacts in InP-based InAlAs/InGaAs HEMTs and their effects on breakdown voltage and kink suppression', Electron. Lett., 1995, 31, (9), pp. 758-759
    • (1995) Electron. Lett. , vol.31 , Issue.9 , pp. 758-759
    • Suemitsu, T.1    Enoki, T.2    Ishii, Y.3
  • 8
    • 0029403829 scopus 로고
    • Electroluminescence of InAlAs/InGaAs HEMT's lattice-matched to InP substrates
    • SHIGEKAWA, N., ENOKI, T., FURUTA, T., and ITOH, H.: 'Electroluminescence of InAlAs/InGaAs HEMT's lattice-matched to InP substrates', IEEE Electron. Device Lett., 1995, 16, (11), pp. 515-517
    • (1995) IEEE Electron. Device Lett. , vol.16 , Issue.11 , pp. 515-517
    • Shigekawa, N.1    Enoki, T.2    Furuta, T.3    Itoh, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.