Secondary ion mass spectroscopy study of Au trapping and migration in the Au-irradiated YBa2Cu3O7-δ film

Applied Physics Letters

Volumn 68, Issue 19, 1996, Pages 2738-2740

  Li, Yupu ^a   Kilner, J A ^a   Liu, J R ^b   Chu, W K ^b   Wagner, G A ^c   Somekh, R E ^c  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY OF HOUSTON   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; ION IMPLANTATION; LANTHANUM COMPOUNDS; OXYGEN; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; SPUTTERING; SUPERCONDUCTING FILMS; SURFACE MEASUREMENT; YTTRIUM COMPOUNDS;

DISPLACEMENT PER ATOM; HIGH PRESSURE DC SPUTTERING; ION MIGRATION; ION TRAPPING; YTTRIUM BARIUM COPPER OXIDE;

GOLD;

EID: 0030572135     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115582     Document Type: Article

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