Measurement of uncompensated resistance and double layer capacitance during the course of a dynamic measurement: Correction for IR drop and charging currents in arbitrary voltammetric techniques

Journal of Electroanalytical Chemistry

Volumn 419, Issue 1, 1996, Pages 99-103

  Åberg, Svante ^a  

^a UMEÅ UNIVERSITY   (Sweden)

Author keywords

Capacitance; Dynamic measurements; Resistance; Voltammetry

Indexed keywords

CAPACITANCE MEASUREMENT; CYCLIC VOLTAMMETRY; ELECTRIC CURRENTS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRIC WAVEFORMS; SPECTROSCOPIC ANALYSIS;

DYNAMIC MEASUREMENTS;

ELECTROCHEMISTRY;

EID: 0030571398     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(96)04860-7     Document Type: Article

References (9)

1. L. Nadjo, J.M. Savéant and D. Tessier, J. Electroanal. Chem., 52 (1974) 403.
2. R.M. Penner, L.S. Van Dyke and C.R. Martin, J. Phys. Chem., 92 (1988) 5274.
3. S. Åberg, in preparation.
4. W. Richtering and K. Doblhofer, Electrochim. Acta, 34 (1989) 1685.
5. S. Åberg and M. Sharp, J. Electroanal. Chem., 403 (1996) 31.
6. K.B. Oldham, J. Electroanal. Chem., 11 (1966) 171.
7. J.C. Imbeaux and J.M. Savéant, J. Electroanal. Chem., 44 (1973) 169.
8. S.A. Campbell and L.M. Peter, J. Electroanal. Chem., 364 (1994) 257.
9. M. Grenness and K.B. Oldham, Anal. Chem., 44 (1972) 1121.