Chemical inhomogeneity and reactions of BiSrCaCuO surfaces detected by synchrotron imaging spectromicroscopy

Applied Physics Letters

Volumn 69, Issue 19, 1996, Pages 2924-2926

  Hwu, Y ^a   Cheng, N F ^a   Lee, S D ^a   Tung, C Y ^a   Almeras P ^b   Berger, H ^b  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; IMAGING SYSTEMS; MICROSCOPIC EXAMINATION; MORPHOLOGY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SINGLE CRYSTALS; STOICHIOMETRY; SURFACES; SYNCHROTRON RADIATION;

CHEMICAL INHOMOGENEITY; IMAGING PHOTOELECTRON SPECTROMICROSCOPY; MICROIMAGES; SYNCHROTRON IMAGING SPECTROMICROSCOPY;

OXIDE SUPERCONDUCTORS;

EID: 0030569173     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117325     Document Type: Article

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