All-CMOS temperature independent current reference

Electronics Letters

Volumn 32, Issue 14, 1996, Pages 1280-1281

  Lee, C H ^a   Park, H J ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

CMOS integrated circuits; Reference circuits

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; INVERSE PROBLEMS; MOSFET DEVICES; RESISTORS; SCHEMATIC DIAGRAMS; THERMAL EFFECTS;

CURRENT MIRROR CIRCUIT; MOBILITY DEPENDENCE; REFERENCE CIRCUIT; SQUARE ROOT CIRCUIT; TEMPERATURE DEPENDENCE;

CMOS INTEGRATED CIRCUITS;

EID: 0030568696     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960827     Document Type: Article

References (4)

1. LABER, C.L., RAHIM, C.F., DREYER, S.F., UEHARA, G.T., KWOK, P.T., and GRAY, P.R.: 'Design considerations for a high-performance 3μm CMOS analog standard-cell library', IEEE J. Solid-State Circuits, 1987, SC-22, (2), pp. 181-189
2. SANSEN, W.M., EYNDE, F.O., and STEYAERT, M.: 'A CMOS temperature-compensated current reference', IEEE J. Solid-State Circuits, 1988, SC-23, (3), pp. 821-824
3. KIM, M.K., and LEE, S.H.: 'A CMOS on-chip current reference circuit', IC design contest',Tech. Dig. Papers, Korea Businessmen's Council, 1994, pp. 5-24
4. GRAY, P.R., and MEYER, R.G.: 'Analysis and design of analog integrated circuits, third edn.' (John Wiley and Sons, 1993), pp.708-709