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Physical Review Letters

Volumn 76, Issue 23, 1996, Pages 4320-4323

Final ion-charge resolving electron spectroscopy: Photoionization studies on sm and eu

(5) Luhmann, T a Gerth, Ch a Martins, M a Richter, M a Zimmermann, P a

a TECHNISCHE UNIVERSITÄT BERLIN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; EUROPIUM; PERTURBATION TECHNIQUES; PHOTOIONIZATION; PROBABILITY; SAMARIUM; STORAGE RINGS; SYNCHROTRON RADIATION;

AUGER PROCESSES; ELECTRON ION COINCIDENCE; FINAL ION CHARGE RESOLVING ELECTRON SPECTROSCOPY; KINETIC ENERGY; MANY ELECTRON DECAY; MICROCHANNEL PLATE DETECTORS; PHOTON ENERGY;

ELECTRON SPECTROSCOPY;

EID: 0030567639 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.76.4320 Document Type: Article

Times cited : (15)

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