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Journal of Crystal Growth

Volumn 169, Issue 4, 1996, Pages 715-721

Structural characterization of a-axis oriented YBa2Cu3Ox films grown by liquid phase epitaxy

(4) Mukaida, M a Miyazawa, S a Klemenz, C b Scheel, H J b

a NTT CORPORATION (Japan)

b EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; LANTHANUM COMPOUNDS; LIQUID PHASE EPITAXY; OPTICAL MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; YTTRIUM COMPOUNDS;

POLARIZED OPTICAL MICROSCOPY;

SUPERCONDUCTING FILMS;

EID: 0030566442 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(96)00469-1 Document Type: Article

Times cited : (9)

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