Dynamic features in generation and disappearance of Si(111)-7 × 7 domains

Applied Surface Science

Volumn 107, Issue , 1996, Pages 53-57

  Hoshino, T ^a   Ishimaru, T ^a   Kumamoto, K ^a   Kawada, H ^a   Ohdomari, I ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE TRANSITIONS; QUENCHING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR GROWTH; SHRINKAGE; SURFACE STRUCTURE; THERMAL EFFECTS;

SUPERCOOLING CONDITIONS; SURFACE RECONSTRUCTIONS;

SEMICONDUCTING SILICON;

EID: 0030566280     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00509-0     Document Type: Article

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