A mini-ALE attachment to UHV surface analysis equipment

Applied Surface Science

Volumn 107, Issue , 1996, Pages 255-259

  Van Welzenis, R G ^a   Bink, R A M ^a   Brongersma, H H ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSTS; SURFACE STRUCTURE; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC LAYER EPITAXY (ALE); LOW ENERGY ION SCATTERING (LEIS); ULTRAHIGH VACUUM SURFACE ANALYSIS EQUIPMENT;

EPITAXIAL GROWTH;

EID: 0030566247     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00496-5     Document Type: Article

References (4)

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2. J.-P. Jacobs, L.P. Lindfors, J.G. Reintjes, O. Jylhä and H.H. Brongersma. Catal. Lett. 25 (1994) 315.
3. E.-L. Laakomaa, Abstracts ACSI-2, Joensuu, Finland (1993) p. 58.
4. J.A.R. van Veen, G. Jonkers and W.H. Hesselink, J. Chem. Soc. Faraday Trans. I, 85 (1989) 389.