The thickness dependence of anisotropic magnetoresistance in a Co35Pd65 film

Journal of Magnetism and Magnetic Materials

Volumn 164, Issue 1-2, 1996, Pages 49-52

  Jen, S U ^a   Wei, C T ^a   Huang, J Y ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Anisotropic magnetoresistance; Electrical resistivity; Grain size; Thin film

Indexed keywords

COBALT ALLOYS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNETIZATION; MAGNETORESISTANCE; VAPOR DEPOSITION;

ANISOTROPIC MAGNETORESISTANCE (AMR);

MAGNETIC THIN FILMS;

EID: 0030566211     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(96)00364-2     Document Type: Article

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