Manganese perovskites: Thick-film based position sensors fabrication

Applied Physics Letters

Volumn 69, Issue 10, 1996, Pages 1486-1488

  Balcells, Ll ^a   Enrich, R ^a   Mora, J ^a   Calleja, A ^a   Fontcuberta, J ^a   Obradors, X ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC FIELD EFFECTS; FILM GROWTH; FILM PREPARATION; MAGNETORESISTANCE; PRINTING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING MANGANESE COMPOUNDS; SENSORS; X RAY DIFFRACTION ANALYSIS;

HIGH TEMPERATURE FIRING; MAGNETIC SENSORS; MAGNETORESISTIVE FILMS; MANGANESE PEROVSKITES; SOLID STATE REACTION TECHNIQUES; SPRAY PRINTING;

THICK FILMS;

EID: 0030565357     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116916     Document Type: Article

References (14)

1. R. von Helmolt, J. Weckerg, B. Holzapfel, L. Schultz, and K. Samwer, Phys. Rev. Lett. 71, 2331 (1993); S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); S. Jin, H. M. O'Bryan, T. H. Tiefel, M. McCormack, and W. W. Rhodes, Appl. Phys. Lett. 66, 382 (1995).
2. R. von Helmolt, J. Weckerg, B. Holzapfel, L. Schultz, and K. Samwer, Phys. Rev. Lett. 71, 2331 (1993); S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); S. Jin, H. M. O'Bryan, T. H. Tiefel, M. McCormack, and W. W. Rhodes, Appl. Phys. Lett. 66, 382 (1995).
3. R. von Helmolt, J. Weckerg, B. Holzapfel, L. Schultz, and K. Samwer, Phys. Rev. Lett. 71, 2331 (1993); S. Jin, T. H. Tiefel, M. McCormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science 264, 413 (1994); S. Jin, H. M. O'Bryan, T. H. Tiefel, M. McCormack, and W. W. Rhodes, Appl. Phys. Lett. 66, 382 (1995).
4. J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, J. L. Garcia-Muñoz, and X. Obradors, Phys. Rev. Lett. 76, 1122 (1996); H. Y. Hwang, S.-W. Cheong, P. G. Radaelli, M. Marezio, and B. Batlogg, ibid. 75, 914 (1995); Y. Tomioka, A. Asamitsu, Y. Moritomo, H. Kuwahara, and Y. Tokura, ibid. 74, 5108 (1995).
5. J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, J. L. Garcia-Muñoz, and X. Obradors, Phys. Rev. Lett. 76, 1122 (1996); H. Y. Hwang, S.-W. Cheong, P. G. Radaelli, M. Marezio, and B. Batlogg, ibid. 75, 914 (1995); Y. Tomioka, A. Asamitsu, Y. Moritomo, H. Kuwahara, and Y. Tokura, ibid. 74, 5108 (1995).
6. J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, J. L. Garcia-Muñoz, and X. Obradors, Phys. Rev. Lett. 76, 1122 (1996); H. Y. Hwang, S.-W. Cheong, P. G. Radaelli, M. Marezio, and B. Batlogg, ibid. 75, 914 (1995); Y. Tomioka, A. Asamitsu, Y. Moritomo, H. Kuwahara, and Y. Tokura, ibid. 74, 5108 (1995).
7. S. S. P. Parkin, Z. G. Li, and D. J. Smith, Appl. Phys. Lett. 58, 2710 (1991).
8. S. S. P. Parkin and T. Rabedeau, Appl. Phys. Lett. 68, 1162 (1996).
9. Thick Film Sensors, edited by M. Prudenziati (Elsevier, Amsterdam, 1994).
10. J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, J. L. Garcia-Muñoz, and X. Obradors, Europhys. Lett. 34, 379 (1996); J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, A. Roig, E. Molins, X. Obradors, J. Alonso, and J. M. Gonzalez-Calbet, J. Appl. Phys. 79, 5182 (1996).
11. J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, J. L. Garcia-Muñoz, and X. Obradors, Europhys. Lett. 34, 379 (1996); J. Fontcuberta, B. Martinez, A. Seffar, S. Piñol, A. Roig, E. Molins, X. Obradors, J. Alonso, and J. M. Gonzalez-Calbet, J. Appl. Phys. 79, 5182 (1996).
12. Y. Tokura, A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, G. Kido, and N. Furukawa, J. Phys. Soc. Jpn 63, 3931 (1994); R. Mahendiran, S. K. Tiwary, A. K. Raychaudhuri, T. V. Ramakrishnan, R. Mahest, R. Ragavittal, and C. N. R. Rao, Phys. Rev. B 53, 3348 (1996).
13. Y. Tokura, A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, G. Kido, and N. Furukawa, J. Phys. Soc. Jpn 63, 3931 (1994); R. Mahendiran, S. K. Tiwary, A. K. Raychaudhuri, T. V. Ramakrishnan, R. Mahest, R. Ragavittal, and C. N. R. Rao, Phys. Rev. B 53, 3348 (1996).
14. H. L. Ju, J. Gopalakrishnan, J. L. Peng, Q. Li, G. C. Xiong, T. Venkatesan, and R. L. Greene, Phys. Rev. B 51, 6143 (1996).