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Volumn 118, Issue 1-4, 1996, Pages 274-277

Comparison of elastic resonance and elastic recoil detection in the quantification of carbon in SiGeC

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHEMICAL VAPOR DEPOSITION; CONCENTRATION (PROCESS); FILM GROWTH; IONS; RESONANCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCATTERING;

EID: 0030565154     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01468-3     Document Type: Article
Times cited : (3)

References (10)
  • 3
    • 30244513794 scopus 로고    scopus 로고
    • Cornell University, private communication
    • P. Revesz, Cornell University, private communication.
    • Revesz, P.1
  • 6
    • 30244507618 scopus 로고    scopus 로고
    • Sandia National Laboratories, Dept. 1111, Albuquerque, NM
    • J.C. Barbour (1994) SERDAP computer program (Sandia National Laboratories, Dept. 1111, Albuquerque, NM).
    • SERDAP Computer Program , vol.1994
    • Barbour, J.C.1
  • 10
    • 0003419936 scopus 로고
    • eds. J.R. Tesmer, M. Nastasi, C.J. Maggiore, J.C. Barbour and J.W. Mayer, Materials Research Society, Pittsburgh, PA chap. 5
    • J.C. Barbour and B.L. Doyle, in: Handbook of Modern Ion Beam Materials Analysis, eds. J.R. Tesmer, M. Nastasi, C.J. Maggiore, J.C. Barbour and J.W. Mayer, Materials Research Society, Pittsburgh, PA (1995) chap. 5.
    • (1995) Handbook of Modern Ion Beam Materials Analysis
    • Barbour, J.C.1    Doyle, B.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.