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Volumn 118, Issue 1-4, 1996, Pages 274-277
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Comparison of elastic resonance and elastic recoil detection in the quantification of carbon in SiGeC
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
CHEMICAL VAPOR DEPOSITION;
CONCENTRATION (PROCESS);
FILM GROWTH;
IONS;
RESONANCE;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCATTERING;
CARBON CONCENTRATIONS;
CARBON SCATTERING CROSS SECTION;
ELASTIC RECOIL DETECTION;
ELASTIC RESONANCE REACTION;
ION ANALYSIS TECHNIQUES;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 0030565154
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)01468-3 Document Type: Article |
Times cited : (3)
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References (10)
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