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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 118, Issue 1-4, 1996, Pages 488-492

Surface and sub-surface defects on graphite after single ion impact studied with STM

(4) Bolse, W a Reimann, K a Geyer, U a Lieb, K P a

a UNIVERSITY OF GÖTTINGEN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; GRAPHITE; HELIUM; ION BOMBARDMENT; IRRADIATION;

DISPLACEMENT CASCADE; FLUENCES; HILLOCK LIKE DEFECTS; INCIDENT BEAM; INTERSTITIAL CLUSTERS; INTERSTITIALS; NORMAL INCIDENCE; RECOIL DISTRIBUTION; SINGLE ION IMPACTS; TILTED INCIDENCE;

SCANNING TUNNELING MICROSCOPY;

EID: 0030565153 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/0168-583X(96)00253-4 Document Type: Article

Times cited : (15)

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