A high resolution magnetic spectrograph for ion beam analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 118, Issue 1-4, 1996, Pages 566-572

  Arnoldbik, W M ^a   Wolfswinkel, W ^a   Inia, D K ^a   Verleun, V C G ^a   Lobner, S ^a   Reinders, J A ^b   Labohm, F ^b   Boerma, D O ^a,b  

^a UTRECHT UNIVERSITY   (Netherlands)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; INTERFACES (MATERIALS); ION BEAMS; IONS; OPTICAL FILTERS; PARTICLE ACCELERATORS; PARTICLE DETECTORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS;

ANGULAR SCATTERING; DEPTH RESOLUTION; ELASTIC RECOIL DETECTION; HIGH RESOLUTION MAGNETIC SPECTROGRAPH; ION BEAM ANALYSIS; RESOLVED ANGLES; RESOLVED ENERGY; STRAGGLING SCATTERING; TANDEM ACCELERATOR; ULTRA HIGH VACUUM;

SPECTROGRAPHS;

EID: 0030565136     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00259-5     Document Type: Article

References (6)

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3. S. Kowalski and H. Enge, Laboratory for Nucl. Sci. and Dept. of Phys., Massachusetts Institute of Technology, technical report (1985).
4. J.S. Lapington, A.D. Smith, D.M. Walton and H.E. Schwarz, IEEE Trans. Nucl. Sci. 34 (1987) 431.
5. E. Szilági and F. Pászti, Nucl. Instr. and Meth. 85 (1994) 616.
6. N. Kabachnik, J. Phys. B 26 (1993) 3803.