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Volumn 118, Issue 1-4, 1996, Pages 533-540
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Depth profile analysis of strong metal-support interactions on Rh/TiO2 model catalysts
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC SPECTROSCOPY;
ELECTRIC CONDUCTIVITY;
ENCAPSULATION;
INTERFACES (MATERIALS);
MODELS;
OXIDATION;
OXIDES;
RHODIUM;
SPUTTERING;
TITANIUM DIOXIDE;
TRANSITION METALS;
ATOMIC LAYER;
DEPTH PROFILE;
FREE INTERFACE ENERGY;
ION SCATTERING SPECTROSCOPY;
METAL CLUSTERS;
SPUTTER EROSION;
STRONG METAL SUPPORT INTERACTIONS;
CATALYSTS;
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EID: 0030565040
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)01480-2 Document Type: Article |
Times cited : (13)
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References (34)
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