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Volumn 165, Issue 4, 1996, Pages 358-361

Oxygen transport mechanism in Si melt during single crystal growth in the Czochralski system

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRUCIBLES; HEAT CONVECTION; INTERFACES (MATERIALS); LIQUID METALS; OXYGEN; SILICON; SINGLE CRYSTALS; THREE DIMENSIONAL; TRANSPORT PROPERTIES;

EID: 0030564776     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(96)00212-6     Document Type: Article
Times cited : (30)

References (10)
  • 3
    • 84917800925 scopus 로고
    • Eds. H.R. Huff and E. Sirtl The Electrochemical Society, Princeton, NJ
    • J.R. Curruthers, A.F. Witt and R.E. Reusser, Semiconductor Silicon, Eds. H.R. Huff and E. Sirtl (The Electrochemical Society, Princeton, NJ, 1977) p. 61.
    • (1977) Semiconductor Silicon , pp. 61
    • Curruthers, J.R.1    Witt, A.F.2    Reusser, R.E.3
  • 4
    • 0003767280 scopus 로고
    • Eds. H.R. Huff and E. Sirtl The Electrochemical Society, Princeton, NJ
    • A. Murgai, H.C. Gatos and A.F. Witt, Semiconductor Silicon, Eds. H.R. Huff and E. Sirtl (The Electrochemical Society, Princeton, NJ, 1977) p. 72.
    • (1977) Semiconductor Silicon , pp. 72
    • Murgai, A.1    Gatos, H.C.2    Witt, A.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.