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Volumn 165, Issue 4, 1996, Pages 358-361
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Oxygen transport mechanism in Si melt during single crystal growth in the Czochralski system
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRUCIBLES;
HEAT CONVECTION;
INTERFACES (MATERIALS);
LIQUID METALS;
OXYGEN;
SILICON;
SINGLE CRYSTALS;
THREE DIMENSIONAL;
TRANSPORT PROPERTIES;
CARBON SHEET;
CRUCIBLE ROTATION RATE;
CRYSTAL MELT INTERFACE;
GAS MELT INTERFACE;
OXYGEN TRANSPORT MECHANISM;
SILICON MELT;
CRYSTAL GROWTH FROM MELT;
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EID: 0030564776
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(96)00212-6 Document Type: Article |
Times cited : (30)
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References (10)
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