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Volumn 257, Issue 5-6, 1996, Pages 557-562
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Surface impact induced shattering of C60. Detection of small Cm fragments by negative surface ionization
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0030564741
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/0009-2614(96)00587-8 Document Type: Article |
Times cited : (48)
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References (24)
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