Comparison of AES chemical shifts with XPS chemical shifts

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 30-35

  Sekine, Tetsu ^a   Ikeo, Nobuyuki ^a   Nagasawa, Yuji ^a  

^a JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ELECTRON ENERGY ANALYZERS; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; PROBES; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRON KINETIC ENERGY; CHEMICAL SHIFTS; CONCENTRIC HEMISPHERICAL ANALYZER; HIGH ENERGY RESOLUTION; PEAK ENERGIES; PEAK SHAPES; SCANNING AUGER MICROSCOPY; TRANSITION ENERGIES;

AUGER ELECTRON SPECTROSCOPY;

EID: 0030564539     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00251-6     Document Type: Article

References (6)

1. T. Sekine, N. Ikeo, Y. Nagasawa, M. Kudo, M. Kato and S. Hofmann, JEOL News 31E (1) (1994) 41.
2. J. Michael Hollas, Modem Spectroscopy, 2nd ed. (Wiley, New York, 1993) pp. 298-301.
3. C.D. Wagner, in: Practical Surface Analysis, 2nd ed., Eds. D. Briggs and M.P. Seah (Wiley, Chichester, 1990) Appendix 5.
4. NIST X-ray Photoelectron Spectroscopy Database, National Institute of Standards and Technology (Gaithersburg, MD 20899, USA).
5. N. Ikeo, Y. Iijima, N. Niimura, M. Shigematsu, T. Tazawa, S. Matsumoto, K. Kojima and Y. Nagasawa, Handbook of X-ray Photoelectron Spectroscopy (JEOL, Tokyo, 1991).
6. J.E. Houston and R.R. Rye, in: Auger Electron Spectroscopy, Eds. C.L. Briant and R.P. Messmer (Academic Press, Boston, 1988) ch. 3.