Trajectory dependent charge-state distribution of planar channeled heavy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 115, Issue 1-4, 1996, Pages 310-314

  Azuma, T ^a   Komaki, K ^a   Yamagata, M ^a   Yamazaki, Y ^a   Sekiguchi, M ^a   Hattori, T ^b   Hasegawa, T ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^c UNIVERSITY OF MIYAZAKI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON TRANSITIONS; MONTE CARLO METHODS; OXYGEN; PROBABILITY; SILICON; SINGLE CRYSTALS;

CHARGE STATE DISTRIBUTION; ELECTRON CAPTURE PROBABILITY; ELECTRON LOSS PROBABILITY; IMPACT PARAMETERS; ION TRAJECTORY; PLANAR HEAVY ION CHANNELING; TRANSVERSE ENERGY CONSERVATION RULE;

IONS;

EID: 0030564439     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01437-3     Document Type: Article

References (6)

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2. S. Datz, F.W. Martin, C.D. Moak, B.R. Appleton and L.B. Bridwell, Radiat. Eff. 12 (1972) 163: and see other references in: D.S. Gemmell, Rev. Mod. Phys. 46 (1974) 129.
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