L X-ray emission from slow multiply charged Ar ions bombarding Be and Al targets

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 115, Issue 1-4, 1996, Pages 177-180

  Ninomiya, S ^a   Yamazaki, Y ^a   Sawatari, K ^b   Irako, M ^b   Komaki, K ^a   Azuma, T ^a   Kuroki, K ^c   Sekiguchi, M ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b TOKYO METROPOLITAN UNIVERSITY   (Japan)

^c NATIONAL RESEARCH INSTITUTE OF POLICE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ARGON; BERYLLIUM; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; EMISSION SPECTROSCOPY; TARGETS;

MULTIPLY CHARGED IONS;

ION BOMBARDMENT;

EID: 0030564380     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00157-7     Document Type: Article

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