Carbon Auger peak shape measurements in the characterization of reactions on (001) diamond

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 612-616

  Viljoen, P E ^a   Roos, W D ^a   Swart, H C ^a   Holloway, P H ^b  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

^b University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ARGON; CALCULATIONS; CARBON; CHEMICAL BONDS; CHEMICAL MODIFICATION; CHEMICAL REACTIONS; COMPUTER SIMULATION; ELECTRON TRANSITIONS; OHMIC CONTACTS; SPUTTERING; SURFACE TREATMENT;

CARBON AUGER PEAK SHAPE MEASUREMENTS; ION SPUTTERING; TRANSITION PROBABILITY;

SEMICONDUCTING DIAMONDS;

EID: 0030564355     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00349-2     Document Type: Article

References (10)

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