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Volumn 100-101, Issue , 1996, Pages 116-119
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Structural properties of epitaxially grown perfluoro n-alkane thin films prepared by vapor deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
EPITAXIAL GROWTH;
LATTICE CONSTANTS;
PARAFFINS;
POTASSIUM COMPOUNDS;
VAPOR DEPOSITION;
X RAY CRYSTALLOGRAPHY;
ENERGY DISPERSIVE TOTAL REFLECTION X RAY DIFFRACTOMETER;
ORIENTATIONAL DISTRIBUTION;
PERFLUORO N ALKANE THIN FILMS;
POTASSIUM CHLORIDE;
RANDOMLY ORIENTED DOMAIN STRUCTURE;
THIN FILMS;
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EID: 0030564311
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(96)00268-1 Document Type: Article |
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Times cited : (2)
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References (4)
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