Intrinsic Auger signal profiles derived by Monte Carlo analysis

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 15-19

  Ding, Z J ^a   Shimizu, R ^b   Goto, K ^c  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b OSAKA UNIVERSITY   (Japan)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; COPPER; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ELECTRONS; MONTE CARLO METHODS;

AUGER SIGNAL PROFILES; BACKSCATTERED ELECTRONS; CYLINDRICAL MIRROR ANALYZER; ELECTRON GENERATION; SUBTRACTION METHOD;

AUGER ELECTRON SPECTROSCOPY;

EID: 0030564281     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00248-6     Document Type: Article

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