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Volumn 163, Issue 4, 1996, Pages 353-358
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Growth and electrical properties of PbTe epitaxial layers grown by temperature difference method under controlled vapor pressure liquid phase epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRIC PROPERTIES;
LEAD;
LIQUID PHASE EPITAXY;
MORPHOLOGY;
SEMICONDUCTING LEAD COMPOUNDS;
SOLVENTS;
TELLURIUM;
TEMPERATURE MEASUREMENT;
VAPOR PRESSURE;
CONTROLLED VAPOR PRESSURE;
GROWTH TEMPERATURE;
GROWTH THICKNESS;
GROWTH TIME;
LEAD TELLURIDE EPITAXIAL LAYER;
SUBSIDIARY HEATER POWER;
TEMPERATURE DIFFERENCE METHOD;
SEMICONDUCTING FILMS;
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EID: 0030564241
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(95)00992-2 Document Type: Article |
Times cited : (11)
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References (15)
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