High-resolution magnetic imaging based on scanning probe techniques

Journal of Magnetism and Magnetic Materials

Volumn 157-158, Issue , 1996, Pages 545-549

  Hartmann, U ^a,b  

^a SAARLAND UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Atomic force microscopy; Magnetic force microscopy; Magnetic imaging techniques; Near field magneto optical microscopy; Scanning tunneling microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPES; IMAGING TECHNIQUES; MAGNETIC VARIABLES MEASUREMENT; SCANNING ELECTRON MICROSCOPY;

MAGNETIC FORCE MICROSCOPY (MFM); MAGNETIC IMAGING TECHNIQUES; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); SCANNING PROBE METHODS; SPIN POLARIZED SCANNING TUNNELING MICROSCOPY (SPSTM);

MAGNETIC RESONANCE IMAGING;

EID: 0030563883     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)01264-8     Document Type: Article

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