Visible luminescence from Ge nanocrystals embedded in a-Si1-xOx films: Correlation of optical properties and size distribution

Journal of Non-Crystalline Solids

Volumn 198-200, Issue PART 1, 1996, Pages 115-118

  Zacharias, M ^a   Christen, J ^a   Basing J ^a   Bimberg, D ^b  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CATHODOLUMINESCENCE; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; EPITAXIAL GROWTH; GERMANIUM; MATHEMATICAL MODELS; OXIDATION; PHOTOLUMINESCENCE; PLASMA APPLICATIONS; SILICON COMPOUNDS;

AMORPHOUS SILICON OXIDE FILMS; GERMANIUM NANOCRYSTALS; PLASMA CHEMICAL VAPOR DEPOSITION; QUANTUM CONFINEMENT MODEL;

NANOSTRUCTURED MATERIALS;

EID: 0030563567     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00664-8     Document Type: Article

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