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Volumn 198-200, Issue PART 1, 1996, Pages 391-394
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A novel approach to the analysis of sub-bandgap absorption in a-Si:H based materials
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ELECTRON ENERGY LEVELS;
ELECTRONIC DENSITY OF STATES;
ENERGY GAP;
OPTICAL VARIABLES MEASUREMENT;
PHOTOCONDUCTIVITY;
REFLECTION;
SOLAR CELLS;
THIN FILM TRANSISTORS;
DUAL BEAM PHOTOCONDUCTIVITY;
INTERFERENCE FRINGES;
OPTICAL CONSTANTS;
ABSORPTION SPECTROSCOPY;
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EID: 0030563546
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00738-5 Document Type: Article |
Times cited : (2)
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References (9)
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