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Volumn 112, Issue 1-4, 1996, Pages 156-159
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Molecular dynamics study of the fluence dependence of Si sputtering by 1 keV Ar+ ions
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
COMPUTER SIMULATION;
MOLECULAR DYNAMICS;
SILICON;
SPUTTERING;
FLUENCE DEPENDENCE;
SPUTTERING ENHANCEMENT;
ION BOMBARDMENT;
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EID: 0030563532
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(95)01140-4 Document Type: Article |
Times cited : (9)
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References (13)
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