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Volumn 112, Issue 1-4, 1996, Pages 156-159

Molecular dynamics study of the fluence dependence of Si sputtering by 1 keV Ar+ ions

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; COMPUTER SIMULATION; MOLECULAR DYNAMICS; SILICON; SPUTTERING;

EID: 0030563532     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01140-4     Document Type: Article
Times cited : (9)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.