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Volumn 198-200, Issue PART 1, 1996, Pages 395-398

Origin of charged dangling bonds in nitrogen-doped hydrogenated amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRON ENERGY LEVELS; ELECTRON SPIN RESONANCE SPECTROSCOPY; PHOTOCONDUCTIVITY;

EID: 0030563513     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00741-5     Document Type: Article
Times cited : (10)

References (10)
  • 10
    • 0021567845 scopus 로고
    • ed. J.I. Pankove Academic Press, New York, ch. 6
    • S. Lannin, in: Semiconductors and Semimetals, Vol. 21, Part B, ed. J.I. Pankove (Academic Press, New York, 1984) ch. 6, p. 159.
    • (1984) Semiconductors and Semimetals , vol.21 , Issue.PART B , pp. 159
    • Lannin, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.