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Volumn 198-200, Issue PART 1, 1996, Pages 395-398
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Origin of charged dangling bonds in nitrogen-doped hydrogenated amorphous silicon
a,b a,c a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
CHEMICAL BONDS;
CHEMICAL VAPOR DEPOSITION;
DOPING (ADDITIVES);
ELECTRIC CONDUCTIVITY;
ELECTRON ENERGY LEVELS;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
PHOTOCONDUCTIVITY;
DANGLING BONDS;
DARK CONDUCTIVITY;
PROBING LIGHT;
AMORPHOUS SILICON;
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EID: 0030563513
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00741-5 Document Type: Article |
Times cited : (10)
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References (10)
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