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Volumn 112, Issue 1-4, 1996, Pages 105-108

STM investigation of energetic carbon cluster ion penetration depth into HOPG

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; FULLERENES; IONS; RADIATION EFFECTS; SCANNING TUNNELING MICROSCOPY; SURFACES;

EID: 0030563492     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01015-7     Document Type: Article
Times cited : (38)

References (17)
  • 10
    • 0038939050 scopus 로고    scopus 로고
    • note
    • Among a set of blank runs for various conditions, samples were introduced into the system and biased for 10 min (about 5 times the irradiation time) at the corresponding high voltage. Without ion irradiation the biased blanks showed no difference from freshly cleaved samples before and after the oxidation procedure. Generally, blank measurements were carried out using targets derived from the same HOPG sample as that irradiated.
  • 14
    • 0001032484 scopus 로고
    • Ph.D. thesis, University of Karlsruhe
    • H.-G. Bussmann, Th. Lill, B. Reif, I.V. Hertel and H.G. Maguire, J. Chem. Phys. 98 (1993) 7574; P. Weis, Ph.D. thesis, University of Karlsruhe (1995).
    • (1995)
    • Weis, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.