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Volumn 198-200, Issue PART 1, 1996, Pages 77-80
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Nuclear magnetic resonance studies of amorphous deuterated silicon nitride thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
CHEMICAL VAPOR DEPOSITION;
DEUTERIUM;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
PLASMA APPLICATIONS;
SILICON NITRIDE;
AMORPHOUS DEUTERATED SILICON NITRIDE THIN FILMS;
BOND STRETCHING FREQUENCIES;
CENTER FREQUENCIES;
DEUTERON MAGNETIC RESONANCE;
DOUBLET CUSP SPLITTING;
LOCAL BONDING PROPERTIES;
QUADRUPOLAR BROADENED PAKE TYPE DOUBLETS;
AMORPHOUS FILMS;
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EID: 0030563441
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00662-1 Document Type: Article |
Times cited : (6)
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References (7)
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