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Volumn 198-200, Issue PART 2, 1996, Pages 675-679

Comparison between electrical properties and electronic structure of variously-prepared germanium selenide films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; ENERGY GAP; EVAPORATION; FERMI LEVEL; GERMANIUM COMPOUNDS; PHOTOCONDUCTIVITY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030563402     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(96)00003-8     Document Type: Article
Times cited : (7)

References (11)
  • 6
    • 4243808948 scopus 로고
    • E. Sleeckx, P. Nagels, R. Callaerts and M. Van Roy, J. Phys. IV 3 (1993) C3-419; J. Non-Cryst. Solids 164-166 (1993) 1195.
    • (1993) J. Non-cryst. Solids , vol.164-166 , pp. 1195
  • 7
    • 8544274469 scopus 로고
    • ed. by J.M. Marshall, N. Kirov and A. Vavrek Reasearch Studies, Taunton, Somerset
    • P. Nagels in Electronic, optoelectronic and magnetic thin films ed. by J.M. Marshall, N. Kirov and A. Vavrek (Reasearch Studies, Taunton, Somerset, 1995) p. 262.
    • (1995) Electronic, Optoelectronic and Magnetic Thin Films , pp. 262
    • Nagels, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.