Direct determination of the quadratic electro-optic coefficient in an a-Si:H based waveguide

Journal of Non-Crystalline Solids

Volumn 198-200, Issue PART 1, 1996, Pages 107-110

  Zelikson, M ^a   Weiser, K ^a   Chack, A ^a   Kanicki, J ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; ELECTROOPTICAL EFFECTS; ESTIMATION; FABRY-PEROT INTERFEROMETERS; FREQUENCIES; HYDROGENATION; INTERFACES (MATERIALS); OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES;

ELECTRO ABSORPTION MEASUREMENT; ELECTRO REFLECTANCE MEASUREMENT; FABRY-PEROT ETALON; HYDROGENATED AMORPHOUS SILICON BASED WAVEGUIDE; INTERFACE CHARGE DENSITY; KRAMERS KRONIG ANALYSIS; MACH-ZENDER INTERFEROMETRY; QUADRATIC ELECTROOPTIC COEFFICIENT; VOLTAGE PULSES;

AMORPHOUS SILICON;

EID: 0030563379     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00654-0     Document Type: Article

References (7)

1. G. Weiser, V. Dersh and P. Thomas, Philos. Mag. B59 (1988) 721.
2. M. Zelikson, K. Weiser J. Salzman and J. Kanicki, Appl. Phys. Lett. 61 (1992) 2660.
3. M. Zelikson, K. Weiser J. Salzman and J. Kanicki, Appl. Phys. Lett. 59 (1991) 2660.
4. T. Moss, G. Burrel and B. Ellis, Semiconductor Opto-Electronics (Butterworths, London, 1973) p. 19.
5. C. Godet, J, Kanicki and A. Gelatos, J. Non-Cryst. Solids 137&138 (1991) 1051.
6. M. Zelikson, K. Weiser, A. Chack and J. Kanicki, unpublished.
7. S.M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981) p. 381.