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Volumn 198-200, Issue PART 1, 1996, Pages 295-299

The relationship between hydrogen and electronic defects in amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DEHYDROGENATION; DIFFUSION; ELECTRONIC DENSITY OF STATES; HYDROGEN; HYDROGEN BONDS; HYDROGENATION; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICES;

EID: 0030563277     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00690-7     Document Type: Article
Times cited : (3)

References (18)
  • 10
    • 0001761379 scopus 로고
    • and references therein
    • M.J. Powell and S.C. Deane, Phys. Rev. B48 (1993) 10815, and references therein.
    • (1993) Phys. Rev. , vol.B48 , pp. 10815
    • Powell, M.J.1    Deane, S.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.