|
Volumn 198-200, Issue PART 1, 1996, Pages 295-299
|
The relationship between hydrogen and electronic defects in amorphous silicon
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DEFECTS;
DEHYDROGENATION;
DIFFUSION;
ELECTRONIC DENSITY OF STATES;
HYDROGEN;
HYDROGEN BONDS;
HYDROGENATION;
MATHEMATICAL MODELS;
SEMICONDUCTOR DEVICES;
DEFECT POOL MODEL;
HYDROGEN DENSITY OF STATES;
HYDROGENATED AMORPHOUS SILICON;
AMORPHOUS SILICON;
|
EID: 0030563277
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00690-7 Document Type: Article |
Times cited : (3)
|
References (18)
|