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Volumn 198-200, Issue PART 1, 1996, Pages 161-164

Determination of the density of states in amorphous silicon-carbon alloys using a Fourier transformation of transient photocurrent data

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; ELECTRONIC DENSITY OF STATES; ENERGY GAP; FOURIER TRANSFORMS; SEMICONDUCTING FILMS;

EID: 0030563216     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(96)80018-4     Document Type: Article
Times cited : (2)

References (10)
  • 9
    • 30244459771 scopus 로고
    • PhD thesis, University of Utrecht
    • R.A.C.M.M. Van Swaaij, PhD thesis, University of Utrecht (1994).
    • (1994)
    • Van Swaaij, R.A.C.M.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.