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Volumn 221, Issue 1-4, 1996, Pages 90-95

Epitaxial growth and lattice match of cobalt and nickel disilicides/Si(111) gold and cobalt doping of NiSi2

Author keywords

[No Author keywords available]

Indexed keywords

COBALT ALLOYS; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); EPITAXIAL GROWTH; INTERFACES (MATERIALS); LATTICE CONSTANTS; NICKEL ALLOYS; SEMICONDUCTING SILICON; THERMAL EXPANSION; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0030563055     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00910-8     Document Type: Article
Times cited : (3)

References (17)
  • 1
    • 0000112472 scopus 로고
    • eds. N.G. Einspruch and G.B. Larrabee (Academic Press, New York), and references therein
    • M.A. Nicolet and S.S. Lau, in: VLSI Electronics, Microstructure Science, Vol. 6, eds. N.G. Einspruch and G.B. Larrabee (Academic Press, New York, 1983) p. 330, and references therein.
    • (1983) VLSI Electronics, Microstructure Science , vol.6 , pp. 330
    • Nicolet, M.A.1    Lau, S.S.2
  • 2
    • 0002673393 scopus 로고
    • eds. C. Dell'Ocaand and W.M. Buller (Electrochemical Society, Pennington)
    • F.M. D'Heurle, in: VLSI Sciences and Technologies, eds. C. Dell'Ocaand and W.M. Buller (Electrochemical Society, Pennington, 1982), p. 194.
    • (1982) VLSI Sciences and Technologies , pp. 194
    • D'Heurle, F.M.1
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.