The use of X-ray standing waves and evanescent-wave emission to study buried strained-layer heterostructures

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 437-444

  Lee, T L ^a   Qian, Y ^a,b   Lyman, P F ^a   Woicik, J C ^c   Pellegrino, J G ^c   Bedzyk, M J ^a,b  

^a Northwestern University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; EPITAXIAL GROWTH; FLUORESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

BRAGG REFLECTION; EVANESCENT WAVE EMISSION EFFECT; HETEROEPITAXIAL STRUCTURE; MACROSCOPIC ELASTICITY THEORY; X RAY STANDING WAVES;

HETEROJUNCTIONS;

EID: 0030563046     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00964-7     Document Type: Article

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