Growth, structuring and characterisation of all-oxide thin film devices prepared by pulsed laser deposition

Applied Surface Science

Volumn 96-98, Issue , 1996, Pages 744-751

  Cillessen, J F M ^a   Wolf, R M ^a   Giesbers, J B ^a   Blom, P W M ^a   Grosse Holz, K O ^a   Pastoor, E ^a,b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; DEPOSITION; DIELECTRIC MATERIALS; FERROELECTRIC DEVICES; FIELD EFFECT SEMICONDUCTOR DEVICES; FILM GROWTH; LASER PULSES; OXIDES; PEROVSKITE; STOICHIOMETRY;

MAGNETIC FERRITE SPINEL FILMS; OXIDIC CONDUCTORS; PULSED LASER DEPOSITION;

THIN FILMS;

EID: 0030563041     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00548-X     Document Type: Article

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