|
Volumn 96-98, Issue , 1996, Pages 827-830
|
Characterization of ZnO thin films deposited by laser ablation in reactive atmosphere
a b c |
Author keywords
[No Author keywords available]
|
Indexed keywords
ACOUSTIC PROPERTIES;
CHARACTERIZATION;
CRYSTAL STRUCTURE;
DEPOSITION;
EXCIMER LASERS;
GLASS;
LASER ABLATION;
MORPHOLOGY;
OPTICAL PROPERTIES;
SILICON WAFERS;
SURFACES;
ZINC OXIDE;
LASER SOURCES;
PIEZOELECTRIC PROPERTIES;
SAPPHIRE PLATES;
YTTRIUM ALUMINUM GARNET LASERS;
THIN FILMS;
|
EID: 0030562946
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00591-9 Document Type: Article |
Times cited : (21)
|
References (17)
|