Scanning tunneling microscopy of charge transfer on the Si(111)7 × 7 surface

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 493-496

  Jeon, D ^a   Hashizume, T ^b,c   Sakurai, T ^b  

^a Myong Ji University   (South Korea)

^b TOHOKU UNIVERSITY   (Japan)

^c HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMS; CHARGE TRANSFER; ELECTRONIC DENSITY OF STATES; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SODIUM;

ADATOMS; SODIUM ADSORBATES;

SURFACES;

EID: 0030562847     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00415-7     Document Type: Article

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