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Volumn 94-95, Issue , 1996, Pages 493-496

Scanning tunneling microscopy of charge transfer on the Si(111)7 × 7 surface

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMS; CHARGE TRANSFER; ELECTRONIC DENSITY OF STATES; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SODIUM;

EID: 0030562847     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00415-7     Document Type: Article
Times cited : (9)

References (9)
  • 2
    • 0040994918 scopus 로고    scopus 로고
    • SAES Getters S.P.A., Via Gallarate 215-1-20151 Milano, Italy.
    • SAES Getters S.P.A., Via Gallarate 215-1-20151 Milano, Italy.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.