A specimen preparation technique for atom probe analysis of the near-surface region of cemented carbides

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 356-361

  Kvist, A ^a   Andren H O ^a   Lundin, L ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; GRINDING (MACHINING); POLISHING; SPECIMEN PREPARATION;

ALTERNATING PULSE POLISHING; ATOM PROBE ANALYSIS; ATOM PROBE FIELD ION MICROSCOPY ANALYSIS; BACK POLISHING; CEMENTED CARBIDE; COMPOSITION GRADIENT; DIMPLE GRINDING; ION MILLING; NEAR SURFACE REGION;

CARBIDES;

EID: 0030562822     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00397-5     Document Type: Article

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