Observation of both Ni and Mo atom images by FIM with imaging plates

Applied Surface Science

Volumn 94-95, Issue , 1996, Pages 295-299

  Nishikawa, Kouichi ^a   Nishiuchi, Takeshi ^a   Yamamoto, Masahiko ^a   Nishikawa, Osamu ^b  

^a OSAKA UNIVERSITY   (Japan)

^b KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; EVAPORATION; ION MICROSCOPES; MICROSCOPIC EXAMINATION; MOLYBDENUM; NICKEL; PROBES; SUPERLATTICES;

FIELD ION MICROSCOPE; IMAGING PLATES; INTERATOMIC BOND; NICKEL MOLYBDENUM ALLOYS;

NICKEL ALLOYS;

EID: 0030562819     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00390-8     Document Type: Article

References (9)

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