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Volumn 92, Issue , 1996, Pages 491-495
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Oxygen etching of the Si(100)-(2 × 1) surface
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ETCHING;
OXYGEN;
PRESSURE;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING SILICON;
SPUTTERING;
TEMPERATURE;
DIMER VACANCIES;
NARROW LINE VACANCIES;
STEP ETCHING;
SURFACES;
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EID: 0030562436
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00283-9 Document Type: Article |
Times cited : (13)
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References (19)
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