Extended X-ray absorption fine structure study of heavily Cl doped ZnSe

Journal of Crystal Growth

Volumn 159, Issue 1-4, 1996, Pages 350-353

  Akimoto, Katsuhiro ^a   Ogawa, Takashi ^a   Maruyama, Takahiro ^a   Kitajima, Yoshinori ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHEMICAL BONDS; CHLORINE; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR DOPING; ZINC;

BOND LENGTH; CHLORINE DOPED ZINC SELENIDE; DEFECT MODEL; DEFECT STRUCTURE; EXTENDED X RAY ABSORPTION FINE STRUCTURE MEASUREMENT;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0030562291     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(95)00595-1     Document Type: Article

References (13)

1. K. Ohkawa, A. Ueno and T. Mitsuyu, J. Crystal Growth 117 (1992) 375.
2. G. Mandel, Phys. Rev. 134A (1964) 1073.
3. G. Mandel, F.F. Morehead and P.R. Wagner, Phys. Rev. 136A (1964) 826.
4. W. Schrittenlacher, H. Nelkowski and H. Pradella, Phys. Status solidi (b) 122 (1984) 285.
5. T. Koda and S. Shionoya, Phys. Rev. 136 (1964) A541.
6. K.M. Lee, Le Si Dang and G.D. Watkins, Solid State Commun. 35 (1980) 527.
7. J.E. Nicholls, J.J. Davies, N.R.J. Poolton, R. Mach and G.O. Muller, J. Crystal Growth 72 (1985) 326.
8. J.J. Davies, J. Crystal Growth 72 (1985) 317.
9. M. Funabashi, T. Ohta, T. Yokoyama, Y. Kitajima and H. Kuroda, Rev. Sci. Instrum. 60 (1989) 2505.
10. T. Yokoyama and T. Ohta, EXAFS Analysis Program "EXAFSH" (The University of Tokyo, Tokyo, 1993).
11. J.J. Rehr, C.H. Booth F. Bridges and S.I. Zabinsky, Phys. Rev. B 49 (1994) 12347.
12. S. Iida, J. Phys. Soc. Jpn. 25 (1968) 177.
13. K.M. Yu, J.W. Ager III, E.D. Bourret, J. Walker and W. Walukiewicz, J. Appl. Phys. 75 (1994) 1378.