SCOPUS 정보 검색 플랫폼

Journal of Crystal Growth

Volumn 159, Issue 1-4, 1996, Pages 723-726

Electrical contacts to p-ZnTe

(5) Trexler, J T a Fijol, J J a Calhoun, L C a Park, R M a Holloway, P H a

a J Crayton Pruitt Family Department of Biomedical Engineering (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; HEAT TREATMENT; MOLECULAR BEAM EPITAXY; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH; THERMODYNAMIC STABILITY; VOLTAGE MEASUREMENT;

FORMATION; RECTIFICATION;

OHMIC CONTACTS;

EID: 0030562273 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/0022-0248(95)00878-0 Document Type: Article

Times cited : (6)

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