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Volumn 159, Issue 1-4, 1996, Pages 58-63
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Heteroepitaxial CdTe(111) grown by MBE on nominally flat and misoriented Si(001) substrates: Characterization by electron microscopy and optical methods
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
CRYSTAL DEFECTS;
ELECTRON TRANSITIONS;
EXCITONS;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SUBSTRATES;
THERMAL EXPANSION;
TRANSMISSION ELECTRON MICROSCOPY;
TWINNING;
BIAXIAL TENSILE STRAIN;
HETEROEPITAXIAL GROWTH;
LOW TEMPERATURE REFLECTANCE;
OPTICAL METHODS;
EPITAXIAL GROWTH;
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EID: 0030562216
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(95)00823-3 Document Type: Article |
Times cited : (13)
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References (22)
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