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Volumn 92, Issue , 1996, Pages 20-29
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LEEM studies of the early stages of epitaxial growth
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON MICROSCOPY;
ELECTRONS;
FILM GROWTH;
IMAGING SYSTEMS;
MAGNETIC PROPERTIES;
METALS;
PHYSICAL PROPERTIES;
SILICON;
STRUCTURE (COMPOSITION);
THIN FILMS;
CHEMICAL CONTRAST MODES;
LOW ENERGY ELECTRON MICROSCOPY;
SILICON HOMOEPITAXY;
EPITAXIAL GROWTH;
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EID: 0030562187
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00196-4 Document Type: Article |
Times cited : (7)
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References (26)
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