Interface phase transition as observed in ultra thin FeSi 2 epilayers

Applied Surface Science

Volumn 92, Issue , 1996, Pages 311-320

  Derrien, J ^a   Berbezier, I ^a   Ronda, A ^a   Natoli, J Y ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; INTEGRATED OPTOELECTRONICS; INTERFACES (MATERIALS); OPTICAL PROPERTIES; PHASE TRANSITIONS; PHYSICAL PROPERTIES; SEMICONDUCTING SILICON; STABILIZATION; SURFACE TREATMENT; THERMAL EFFECTS; ULTRATHIN FILMS;

EPILAYERS; IRON DISILICIDE; OPTICAL GAP; ORTHORHOMBIC DISILICIDE; PHYSICOCHEMICAL PROPERTIES; PSEUDOMORPHIC PHASES;

IRON COMPOUNDS;

EID: 0030562174     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00248-0     Document Type: Article

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